The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Mar. 04, 2015
Tyco Electronics (Shanghai) Co. Ltd., Shanghai, CN;
Tyco Electronics Corporation, Berwyn, PA (US);
Shenzhen Ami Technology Co. Ltd., Guangdong, CN;
Yingcong Deng, Shanghai, CN;
Dandan Zhang, Shanghai, CN;
Roberto Francisco-Yi Lu, Bellevue, WA (US);
Lvhai Hu, Shanghai, CN;
Zinglong Zeng, Guangdong, CN;
Tyco Electronics (Shanghai) Co. Ltd., Shanghai, CN;
Tyco Electronics Corporation, Berwyn, PA (US);
Shenzhen AMI Technology Co. Ltd., Guangdong, CN;
Abstract
A programmable digital machine vision inspection system is disclosed having a programmable automatic feeding system that supplies elements to be inspected, a programmable robot system, a programmable inspection system, a qualified product receiving container, and an unqualified product receiving container. The programmable robot system has a first vision system with an inspection area, and a robot that grips the supplied element and moves the gripped element to and from the inspection area. The programmable inspection system has a second vision system that identifies features of the elements in the inspection area, and determines whether the element is a qualified product based on the identified features. The qualified product receiving container receives identified qualified products from the robot, and the unqualified product receiving container that receives identified unqualified products from the robot.