The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Apr. 02, 2014
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Shuji Ozawa, Hino, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01); H04N 1/38 (2006.01); H04N 1/387 (2006.01); G06T 11/60 (2006.01); H04N 1/32 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1822 (2013.01); G06K 15/1851 (2013.01); G06K 15/1852 (2013.01); G06T 11/60 (2013.01); H04N 1/32309 (2013.01); H04N 1/38 (2013.01); H04N 1/387 (2013.01);
Abstract

An apparatus includes a determination unit configured to determine whether rendering positions of two pieces of rendering data, each representing a semitransparent state by including pixels that are to be rendered by a rendering unit and pixels that are not to be rendered, overlap, and a control unit configured to, if it is determined by the determination unit that the rendering positions of the two pieces of rendering data overlap, perform control such that one of the two pieces of rendering data is not rendered by the rendering unit. Based on the level of the overlap between a plurality of semitransparent objects, the apparatus converts each hatch pattern so that image quality deterioration does not occur.


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