The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Apr. 21, 2014
Applicant:

Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;

Inventors:

Zhuo Liu, Musashino, JP;

Yuichi Sakuraba, Musashino, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06K 9/62 (2006.01); G06F 11/00 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6296 (2013.01); G06F 11/00 (2013.01); G06N 7/005 (2013.01); G06N 5/022 (2013.01);
Abstract

An event analyzer includes an event log collection module configured to collect an event log, an event log storage module configured to convert the event log into an event matrix and to store the event matrix, an event occurrence-order determination module configured to determine occurrence-order of device events based on the event matrix, a Bayesian network generation module configured to specify device events serving as parent node candidates, to calculate evaluation values corresponding to each specified parent node candidate at a virtual device event obtained by shifting the device event serving as a processing object each unit time, and to select an device event serving as a parent node together with a shift amount, and an analysis module configured to output an device event estimated as a cause of an device event to be analyzed, or an device event estimated to occur later based on the shift amount.


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