The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Jun. 04, 2012
Applicant:

Kazuo Yanoo, Tokyo, JP;

Inventor:

Kazuo Yanoo, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 17/50 (2013.01); G06F 11/3604 (2013.01);
Abstract

An evaluation model generation device is provided to generate an evaluation model which evaluates the function or non-function of an IT system based on a system model including a process model which describes processing between processes on the IT system, a server model which describes a physical system configuration of the IT system, and allocations which represent correspondence relations between the elements in the process model and those in the server model. The evaluation model generation device includes: path enumeration meanswhich extracts a process path between processes in the process model, and a server path corresponding to the process path and located on the server model; allocation estimation meanswhich estimates the allocation based on the process path and the server path; and model conversion meanswhich converts the system model into the evaluation model using the process paths, the server paths, and the estimated allocations.


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