The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Mar. 29, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Lei Chang, Beijing, CN;

Zhanwei Wang, Beijing, CN;

Tao Ma, Beijing, CN;

Luke Lonergan, San Carlos, CA (US);

Lirong Jian, Beijing, CN;

Lili Ma, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/02 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30463 (2013.01); G06F 17/30445 (2013.01); G06F 17/30545 (2013.01);
Abstract

A query is executed in a massively parallel processing data storage system comprising a master node communicating with a cluster of multiple segments that access data in distributed storage by producing a self-described query plan at the master node that incorporates changeable metadata and information needed to execute the self-described query plan on the segments, and that incorporates references to obtain static metadata and information for functions and operators of the query plan from metadata stores on the segments. The distributed storage may be the Hadoop distributed file system, and the query plan may be a full function SQL query plan.


Find Patent Forward Citations

Loading…