The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Jan. 30, 2015
Samsung Ltd., Hwaseong-si, KR;
International Business Machines Corporation, Armonk, NY (US);
Sung-Boem Park, Hwaseong-si, KR;
Amir Nahir, Megadim, IL;
Vitali Sokhin, Haifa, IL;
Wisam Kadry, Haifa, IL;
Jin Sung Park, Hwaseong-si, KR;
Ara Cho, Hwaseong-si, KR;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus and product for test generation. The method comprises generating a first set of instructions for a hardware component, that are to be executed when operating in a first mode of operation; in response to a parsed template statement being a marker statement, generating an intermediary set of one or more instructions to cause the hardware component to change the mode of operation to a second mode in accordance with the marker instruction, and modifying the expected mode of the hardware component to a second mode; and generating a second set of instructions for the hardware component, that are to be executed when operating in the second mode of operation. The generation of instructions comprises determining the expected mode and generating instructions in accordance with the expected mode of the hardware component. The generation is performed without having an expected full state of the hardware component.