The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Nov. 26, 2014
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Da Qi Ren, Santa Clara, CA (US);
Zhulin Wei, Santa Clara, CA (US);
Assignee:
FUTUREWEI TECHNOLOGIES, INC., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 11/14 (2006.01); H04L 29/08 (2006.01); G06F 11/07 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2028 (2013.01); G06F 11/0703 (2013.01); G06F 11/1438 (2013.01); G06F 11/1448 (2013.01); G06F 11/1484 (2013.01); H04L 67/1002 (2013.01); H04L 67/1095 (2013.01); G06F 11/203 (2013.01); G06F 2201/84 (2013.01); G06F 2201/85 (2013.01); H04L 43/10 (2013.01);
Abstract
A method of providing failure recovery capabilities to a cloud environment for scientific HPC applications. An HPC application with MPI implementation extends the class of MPI programs to embed the HPC application with various degrees of fault tolerance. An MPI fault tolerance mechanism realizes a recover-and-continue solution. If an error occurs, only failed processes re-spawn, the remaining living processes remain in their original processors/nodes, and system recovery costs are thus minimized.