The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Dec. 28, 2011
Applicants:

Makoto Shishido, Osaka, JP;

Kensuke Okawa, Osaka, JP;

Inventors:

Makoto Shishido, Osaka, JP;

Kensuke Okawa, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/02 (2006.01); G03G 5/06 (2006.01); G03G 5/043 (2006.01); G03G 5/05 (2006.01);
U.S. Cl.
CPC ...
G03G 5/0696 (2013.01); G03G 5/043 (2013.01); G03G 5/0528 (2013.01); G03G 2215/00957 (2013.01);
Abstract

A photosensitive layer in a multilayer electrophotographic photoconductor includes a charge-generation layer including a charge-generating material having, as a major component, a titanyl phthalocyanine crystal which satisfies the conditions (A) and (B) below and a base resin, and a charge-transport layer including a charge-transporting material, the charge-generating material having, as a major component, the titanyl phthalocyanine crystal which has absorption at a wavelength of a charge-neutralizing light and which satisfies the conditions (A) and (B) or an X-form metal-free phthalocyanine crystal which has absorption at the wavelength of the charge-neutralizing light, and a binder resin. (A) In a Cu—Kα characteristic X-ray diffraction spectrum, one peak is present at a Bragg angle 2θ±0.2°=27.2°. (B) In a differential scanning calorimetry, one peak is present in a range of 270° C. to 400° C. except for peaks attributed to vaporization of adsorption water.


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