The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Jan. 25, 2012
Applicants:

Ioachim Pupeza, Munich, DE;

Ferenc Krausz, Garching, DE;

Inventors:

Ioachim Pupeza, Munich, DE;

Ferenc Krausz, Garching, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G02B 27/14 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02B 27/141 (2013.01); G02B 5/3066 (2013.01);
Abstract

A method of spatially splitting a primary radiation beam () with a first radiation component () including an optical wavelength and a second radiation component () having a wavelength shorter than the first radiation component wavelength, said second radiation component () having a second or higher harmonic wavelength relative to the optical wavelength, comprises directing the primary radiation beam () onto a deflection mirror () having a reflective mirror surface () and carrying a refractive plate element (), reflecting the first radiation component () at the reflective mirror surface () and reflecting the second radiation component () at an exposed plate surface () of the refractive plate element (), wherein the reflected radiation components () travel along different beam paths. Furthermore, a method of spatially combining a first beam path of a first radiation component () and a second beam path of a second radiation component () is described, wherein the beam splitting method is reversed. Further more, an optical device for implementing the above methods and applications of the methods are described.


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