The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Oct. 12, 2015
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Katsuyuki Hashimoto, Tokyo, JP;
Kunihiko Sasaki, Tokyo, JP;
Yasunari Matsukawa, Saitama, JP;
Akinori Araya, Kanagawa, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A laser scanning microscope includes a light irradiating portion that irradiates a sample; a PMT that detects fluorescence from the sample and outputs an intensity signal; a data processing portion that converts the intensity signal to brightness information at each pixel; a full-scale setting portion that can set a normal full scale that is smaller than the intensity signal when a light stimulus is given and an expanded full scale that is larger than the normal full scale, as a maximum range of the intensity signal that can be converted to brightness information; and a control portion that determines whether to switch between a normal observation mode and a stimulation observation mode; wherein the full-scale switching portion sets the normal full scale in the normal observation mode and sets the expanded full scale in the stimulation observation mode.