The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

May. 30, 2014
Applicants:

Board of Regents, the University of Texas System, Austin, TX (US);

Université Laval, Quebec, CA;

Inventors:

A. Sam Beddar, Houston, TX (US);

Louis Archambault, Quebec, CA;

Daniel Robertson, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01); G01T 1/29 (2006.01); G01T 1/20 (2006.01); A61N 5/10 (2006.01); G01T 1/10 (2006.01); G01T 1/204 (2006.01);
U.S. Cl.
CPC ...
G01T 1/10 (2013.01); A61N 5/1071 (2013.01); G01T 1/2042 (2013.01); G01T 1/29 (2013.01);
Abstract

An apparatus and method for measuring three-dimensional radiation dose distributions with high spatial and temporal resolution using a large-volume scintillator. The scintillator converts the radiation dose distribution into a visible light distribution. The visible light is transported to one or more photo-detectors, which measure the light intensity. The light signals are processed to correct for optical artifacts, and the three-dimensional light distribution is reconstructed. The reconstructed light distribution is post-processed to convert light amplitudes to measured radiation doses. The high temporal resolution of the detector makes it possible to observe the evolution of a dynamic dose distribution as it changes over time. Integral dose distributions can be measured by summing the dose over time.


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