The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Nov. 16, 2011
Applicants:

Takayuki Hirano, Kobe, JP;

Takashi Kobori, Kobe, JP;

Inventors:

Takayuki Hirano, Kobe, JP;

Takashi Kobori, Kobe, JP;

Assignees:

Kobe Steel, Ltd., Kobe-shi, JP;

KOBELCO RESEARCH INSTITUTE, INC., Kobe-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H01R 13/03 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); G01R 1/06761 (2013.01); H01R 13/03 (2013.01);
Abstract

The present invention provides a contact probe pin in which a carbon film having both of conductivity and durability is formed on a base material with a tip divided, wherein Sn adherence can be reduced as much as possible to be able to maintain stable electrical contact over a long period of time, even under such circumstances that the temperature of a usage environment becomes high. The present invention relates to a contact probe pin, including a tip divided into 2 or more projections and repeatedly coming into contact with a test surface at the projection, wherein a carbon film containing a metal element is formed at least on a surface of the projection, and a radius of curvature at an apex part of the projection is 30 μm or more.


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