The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Feb. 05, 2015
Applicant:
Olympus Corporation, Tokyo, JP;
Inventors:
Nobuaki Sakai, Hachioji, JP;
Yoshitsugu Uekusa, Tachikawa, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01Q 10/00 (2010.01); G01Q 10/04 (2010.01); G01Q 20/02 (2010.01);
U.S. Cl.
CPC ...
G01Q 10/00 (2013.01); G01Q 10/04 (2013.01); G01Q 20/02 (2013.01);
Abstract
A scanning mechanism includes a movable portion to which a scanning target object is attached, and an X-Y actuator to scan the movable portion in an X direction and a Y direction perpendicular to the X direction. The X-Y actuator is symmetrical with respect to a straight line parallel to the Y direction and asymmetrical with respect to a straight line parallel to the X direction.
Sakai, Nobuaki. (2017). Scanning mechanism and scanning probe microscope (U.S. Patent No. 9625491). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9625491
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile