The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Jun. 12, 2014
K+s Aktiengesellschaft, Kassel, DE;
Udo-Walter Lisner, Moers, DE;
Torsten Rest, Heringen, DE;
Jessica Waechter, Eschwege, DE;
Joachim Makowe, Aachen, DE;
Volker Moerkens, Huertgenwald, DE;
Christoph Dominic Gehlen, Aachen, DE;
K+S Aktiengesellschaft, Kassel, DE;
Abstract
(EN) The invention relates to a special LIBS measurement tube focusing unit, referred to simply as LIBS measurement tube, for vertically dipping into a material to be analyzed, which material is moved in a horizontal flow, characterized in that the measurement tube extends vertically and is internally hollow and open at least at the bottom end, such that a bottom edge is formed at the bottom end, the measurement tube has an inlet for coupling in a laser beam and an outlet for coupling out an emission spectrum at the upper end, the measurement tube is constructed in such a way that, in the measurement tube, the laser beam is focused at the material to be analyzed, specifically bulk material, in particular raw, intermediate, and end products from the processing of potash, magnesium, rock salt, or evaporated salt, but without additional scattering and deflection occurring, such that a plasma of the material to be analyzed is produced within the measurement tube by the laser radiation and the emission spectrum of the material to be analyzed reaches the outlet for outcoupling through the interior of the measurement tube, and scrapers () lie on the inner and outer focusing tube wall annularly, preferably at the same vertical height on the focusing tube (), which scrapers are arranged in such a way that the scrapers can be moved vertically in relation to the focusing tube (), such that material to be analyzed that adheres to the focusing tube () on the inside and outside in the lower region can be scraped off by a relative motion of the focusing tube () in relation to the scrapers ().