The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Apr. 19, 2010
Applicants:

Masaki Ishisaka, Himeji, JP;

Kazuki Kishi, Tokyo, JP;

Masakazu Fukuda, Kobe, JP;

Inventors:

Masaki Ishisaka, Himeji, JP;

Kazuki Kishi, Tokyo, JP;

Masakazu Fukuda, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01N 15/147 (2013.01); G01N 2015/0092 (2013.01); G01N 2015/1497 (2013.01);
Abstract

A cell analysis apparatus that can accurately distinguish between an aggregating cell and a non-aggregating cell is provided. The cell analysis apparatus () includes: an optical detection section () for flowing a measurement sample obtained from a biological sample and a pigment into a flow cell (), irradiating the measurement sample flowing in the flow cell () with laser beam and detecting fluorescence from the measurement sample; a signal processing circuit () for acquiring, based on a fluorescence signal outputted from the detection section (), a value reflecting the height of a waveform of the signal and a value reflecting the length of a ridge line of the waveform of the signal; and a system control section () for distinguishing between an aggregating cell formed by aggregation of a plurality of cells and a non-aggregating cell, based on the value reflecting the height of the waveform of the fluorescence signal and the value reflecting the length of the ridge line of the waveform of the fluorescence signal obtained by the signal processing circuit ().


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