The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Feb. 24, 2015
Applicant:
Tokitae Llc, Bellevue, WA (US);
Inventors:
David Gasperino, Lake Forest Park, WA (US);
Matthew P. Horning, Redmond, WA (US);
Kevin Paul Flood Nichols, Issaquah, WA (US);
Phil Rutschman, Seattle, WA (US);
Benjamin K. Wilson, Kirkland, WA (US);
Ozgur Emek Yildirim, Bellevue, WA (US);
Assignee:
TOKITAE LLC, Bellevue, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/63 (2006.01); G01N 33/543 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/63 (2013.01); G01N 21/171 (2013.01); G01N 33/54373 (2013.01); G01N 2021/1714 (2013.01); G01N 2201/0697 (2013.01);
Abstract
Embodiments disclosed herein are directed to photothermal spectroscopy apparatuses and systems for offset synchronous testing of flow assays. Methods of using and operating such photothermal spectroscopy systems are also disclosed.