The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Mar. 14, 2013
Tetra Laval Holdings & Finance S.a., Pully, CH;
Andrea Maselli, Parma, IT;
Bo Runnberg, Smedstorp, SE;
Eugenio Sighinolfi, Modena, IT;
Hans Hallstadius, Lund, SE;
Sylvain Debaecker, Eslöv, SE;
TETRA LAVAL HOLDINGS & FINANCE S.A., Pully, CH;
Abstract
A sensor arrangement for determining a concentration of a substance in an open sample in the presence of an interfering material is disclosed. The sensor arrangement comprises a first light source emitting pulsed light at a first wavelength being absorbed by said substance, a second light source emitting pulsed light at a second wavelength being transmitted through said substance, optical means for directing at least a part of the emitted pulsed light of said first and second wavelengths through the open sample along the same optical path, and a sample detector arranged at an end of the optical path for receiving the emitted light of said first and second wavelengths being transmitted through the sample. The interfering material is formed as deposits on at least one of said optical means being exposed to said substance, and said first wavelength and said second wavelength are absorbed by said interfering material.