The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Oct. 30, 2013
Applicant:

Valmet Automation Oy, Espoo, FI;

Inventor:

Markku Mäntylä, Kangasala, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/57 (2006.01); G01N 21/47 (2006.01); G01N 21/86 (2006.01); G01N 21/89 (2006.01); G01N 33/34 (2006.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); G01N 21/47 (2013.01); G01N 21/86 (2013.01); G01N 21/8901 (2013.01); G01N 33/346 (2013.01); G01N 2201/062 (2013.01); G01N 2201/069 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/12 (2013.01);
Abstract

An apparatus of measuring a small scale property of a sheet, the apparatus includes: a first light source for illuminating the sheet moving with respect to the illumination; a detector for forming a total intensity of reflection of the light illuminating the moving sheet by each detection; a detected dimension of the reflection on the sheet in the direction of the movement being limited the same as or shorter than a lowest acceptable spatial resolution of the measurement; a duration of each detection being equal to or shorter than the lowest acceptable spatial resolution divided by a speed of the moving sheet; and a processing unit for forming information about a small scale variation of gloss of the sheet on the basis of the detections by the detector.


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