The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Mar. 22, 2006
Applicants:

James D. Tate, Lake Jackson, TX (US);

Christopher J. Reed, Port Allen, LA (US);

Christopher H. Domke, Rosharon, TX (US);

Linh Le, Lake Jackson, TX (US);

Mary Beth Seasholtz, Sanford, MI (US);

Andy Weber, Brazoria, TX (US);

Charles Lipp, Lake Jackson, TX (US);

Inventors:

James D. Tate, Lake Jackson, TX (US);

Christopher J. Reed, Port Allen, LA (US);

Christopher H. Domke, Rosharon, TX (US);

Linh Le, Lake Jackson, TX (US);

Mary Beth Seasholtz, Sanford, MI (US);

Andy Weber, Brazoria, TX (US);

Charles Lipp, Lake Jackson, TX (US);

Assignee:

Dow Global Technology LLC, Midland, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 21/3504 (2014.01); G06F 17/11 (2006.01); G06F 17/10 (2006.01); G01N 21/39 (2006.01); G06F 19/12 (2011.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 21/39 (2013.01); G06F 17/10 (2013.01); G06F 17/11 (2013.01); G06F 19/12 (2013.01);
Abstract

Apparatus for spectroscopic analysis which includes a tunable diode laser spectrometer having a digital output signal and a digital computer for receiving the digital output signal from the spectrometer, the digital computer programmed to process the digital output signal using a multivariate regression algorithm. In addition, a spectroscopic method of analysis using such apparatus. Finally, a method for controlling an ethylene cracker hydrogenator.


Find Patent Forward Citations

Loading…