The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Aug. 26, 2014
Empire Technology Development Llc, Wilmington, DE (US);
Edward J. Bawolek, Chandler, AZ (US);
EMPIRE TECHNOLOGY DEVELOPMENT LLC, Wilmington, DE (US);
Abstract
Technologies are generally described for determination of a spectral profile of a sample. A microscope with spectroscopic capability may include a multitude of light sources, one or more photo detectors, and an analysis module. The microscope may be a table-top microscope or a hand-held microscope. The light sources may be configured to illuminate at least one portion of the sample, the photo detectors may be configured to detect returned light from the sample in response to the illumination, and the analysis module may be configured to analyze the detected light to determine a spectral profile of the sample. In some examples, the spectral profile of the sample may be compared to a spectral profile of a reference sample to evaluate the sample, where the sample may be evaluated to determine an identity, a quality, an authenticity, a composition, a density, a reflectivity, and/or an amount of the sample.