The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Jun. 24, 2014
National Institute of Standards and Technology, Gaithersbrug, MD (US);
John Lehman, Boulder, CO (US);
Paul Williams, Erie, CO (US);
Robert Lee, Longmont, CO (US);
Frank Maring, Lafayette, CO (US);
THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE, Washington, DC (US);
SCIENTECH INCORPORATED, Boulder, CO (US);
Abstract
An optical meter includes a force member to receive a force and a reflector disposed on the force member to receive radiation and to communicate a pressure of the radiation to the force member. The reflector includes a reflective surface, and the force member is configured to be displaced in response to receiving the force comprising the pressure. The optical meter is configured to measure a power of the radiation, an energy of the radiation, or a combination thereof based on the pressure. A process for measuring a property of radiation includes receiving radiation by the reflector, reflecting radiation from the reflective surface, communicating a pressure from the reflector to the force member, and displacing the force member.