The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Sep. 29, 2016
Applicant:

Asahi Kasei Microdevices Corporation, Tokyo, JP;

Inventors:

Takenobu Nakamura, Tokyo, JP;

Shigeki Okatake, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); G01R 33/06 (2006.01); G01D 5/14 (2006.01); G01R 33/07 (2006.01);
U.S. Cl.
CPC ...
G01D 5/145 (2013.01); G01R 33/07 (2013.01);
Abstract

A rotation angle measurement apparatus includes: a first Hall element pair for detecting a magnetic component in a first direction; a second Hall element pair for detecting a magnetic component in a second direction different from the first direction; a third Hall element pair for detecting a magnetic component in a third direction different from the first direction and the second direction; and a fourth Hall element pair for detecting a magnetic component in a fourth direction different from the first to third directions. An angle calculation unit calculates a first rotation angle θ of a rotating magnet based upon the strengths of the output signals from the first Hall element pair and the second Hall element pair, and calculates a second rotation angle θc of the rotating magnet based upon the strengths of the output signals from the third Hall element pair and the fourth Hall element pair.


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