The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Oct. 11, 2011
Hidehiko Kuroda, Yokohama, JP;
Yoshihiro Yamashita, Yokohama, JP;
Akio Sumita, Yokohama, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
A thickness measurement apparatus and method to measure an object to be inspected. The thickness measurement apparatus includes: an ultrasonic wave transmission/reception device that receives/transmits an ultrasonic wave to/from a wall of a pipe to be inspected, covered with a heat insulation material; a support device that supports the ultrasonic wave transmission/reception device from an outer surface of the pipe to be inspected; a thickness calculation device that measures a propagation time of the ultrasonic wave received/transmitted by the ultrasonic wave transmission/reception device, and calculates thickness of the pipe to be inspected; a calibration board with a predetermined thickness greater than a thickness of a dead zone of the ultrasonic wave transmission/reception device; and a calibration board adjustment device that moves the calibration board toward and away from a gap between the ultrasonic wave transmission/reception device and the outer surface of the pipe to be inspected.