The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Aug. 24, 2012
Applicants:

Shahar Stein, Petach-Tikva, IL;

Eyal Peleg, Zoran, IL;

George Trendafilov, Ashdod, IL;

Itzik Shaul, Tel Aviv, IL;

Inventors:

Shahar Stein, Petach-Tikva, IL;

Eyal Peleg, Zoran, IL;

George Trendafilov, Ashdod, IL;

Itzik Shaul, Tel Aviv, IL;

Assignee:

Hewlett-Packard Indigo B.V., Amstelveen, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B31F 1/07 (2006.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
B31F 1/07 (2013.01); B31F 2201/0717 (2013.01);
Abstract

There is disclosed a computer program product for carrying out a method of calibrating a thickness of an embossing die, the embossing die being formed from a plurality of ink layers printed by an apparatus. According to the method, an average thickness of an ink layer printed by the apparatus may be calculated, and a target die thickness may be calculated as a function of the average ink layer thickness. A system for implementing a method of calibrating a thickness of an embossing die and a method of measuring a thickness of an embossing die are also disclosed.


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