The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Aug. 25, 2011
Applicants:

Chad R. Munro, Mabou, CA;

Richard W. Van Der Put, Little Judique, CA;

Andreas Burger, Mabou, CA;

Inventors:

Chad R. Munro, Mabou, CA;

Richard W. Van Der Put, Little Judique, CA;

Andreas Burger, Mabou, CA;

Assignee:

Halifax Biomedical Inc., Mabou, Nova Scotia, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 6/02 (2006.01); A61B 6/00 (2006.01); A61B 6/12 (2006.01); A61B 17/70 (2006.01); A61B 17/86 (2006.01); A61F 2/46 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 6/022 (2013.01); A61B 6/486 (2013.01); A61B 6/505 (2013.01); A61B 6/5229 (2013.01); A61B 90/39 (2016.02); A61B 6/12 (2013.01); A61B 17/7032 (2013.01); A61B 17/864 (2013.01); A61B 2090/061 (2016.02); A61B 2090/0812 (2016.02); A61B 2090/3904 (2016.02); A61B 2090/3916 (2016.02); A61B 2090/3966 (2016.02); A61B 2090/3987 (2016.02); A61F 2002/4658 (2013.01);
Abstract

A method of measuring the relative position of a bone implant within a bone in a patient to detect movement between the implant and bone is provided, wherein one or more radiopaque bone markers have been implanted into the bone through a cannulated implant within the bone and one or more radiopaque implant markers have been implanted into the implant. The method comprises: i) determining a first relative position of the bone marker to the implant marker under a first parameter; and ii) determining a second relative position of the bone marker to the implant marker under a second parameter, wherein a change in the position of the bone marker relative to the implant marker from the first relative position to the second relative position is indicative of movement of either the implant or the bone.


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