The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Apr. 25, 2014
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Heng Zhao, Rochester, MN (US);
Pengfei Song, Rochester, MN (US);
Matthew W. Urban, Rochester, MN (US);
Randall Kinnick, Rochester, MN (US);
Armando Manduca, Rochester, MN (US);
James F. Greenleaf, Rochester, MN (US);
Shigao Chen, Rochester, MN (US);
Mayo Foundation for Medical Education and Research, Rochester, MN (US);
Abstract
A system and method for measuring material properties of a medium includes producing a multi-directional wave field in the medium and detecting, with a detection system capable of detecting wave fields propagating in a medium, the multi-directional wave field in at least two spatial dimensions over at least one time instance. The system and method also include determining a lowest wave speed, calculating at least one of wave speed and material properties of the medium, and generating a report indicating the at least one of wave speed and material properties of the medium.