The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2017
Filed:
Oct. 09, 2014
Wavetec Vision Systems, Inc., Aliso Viejo, CA (US);
Edwin Jay Sarver, Carbondale, IL (US);
Thomas D. Padrick, Seattle, WA (US);
WaveTec Vision Systems, Inc., Aliso Viejo, CA (US);
Abstract
An ophthalmic method for determining relationships for calculating intraocular lens (IOL) power correction values is disclosed. The method may involve obtaining estimates of the postoperative optical power of a plurality of eyes undergoing IOL implant surgery. Measurements of the postoperative optical power and of one or more characteristics (e.g., axial length) of the eyes can also be obtained. The eyes can be separated into groups based upon their axial lengths. For each of the groups, a mathematical relationship can be determined for calculating IOL power correction values based on the measured characteristics. The mathematical relationship can reduce prediction error for the respective eyes in each group when applied to the corresponding estimates of the postoperative optical power. Methods and systems are also disclosed for using the IOL power correction values.