The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 2017

Filed:

Jul. 26, 2013
Applicant:

Kowa Company, Ltd., Nagoya-shi, Aichi, JP;

Inventor:

Takuya Hara, Hamamatsu, JP;

Assignee:

Kowa Company, Ltd, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/024 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/0058 (2013.01); A61B 3/024 (2013.01); A61B 3/14 (2013.01); A61B 3/1225 (2013.01);
Abstract

A perimeterfor measuring a visual field by conducting perimetry operations regarding measurement points RG of the subject eyehas meansfor storing perimetry result, meansfor composing the perimetry result as a map image corresponding to a fundus and indicating it on the display, meansfor obtaining and indicating a structure examination image PCof the subject eye, meansfor superimposing the map image MAPon the indicated structure examination image PCand indicating the superimposed as a composite image PC, and meansfor setting a concerned area NA on the composite image PC, and meansfor computing an evaluation value of the perimetry based upon the perimetry result.


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