The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Sep. 16, 2010
Dinesh Ramegowda, Mysore, IN;
Mohammed Ibrahim Mohideen, Bangalore, IN;
Lokesh Rayasandra Boregowda, Bangalore, IN;
Bin Sai, Zuid Holland, NL;
Vijendran Gopalan Venkoparao, Bangalore, IN;
Dinesh Ramegowda, Mysore, IN;
Mohammed Ibrahim Mohideen, Bangalore, IN;
Lokesh Rayasandra Boregowda, Bangalore, IN;
Bin Sai, Zuid Holland, NL;
Vijendran Gopalan Venkoparao, Bangalore, IN;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A system for calibrating a thermal camera with a calibration target. The calibration target may have a pattern which can be seen on an infrared image captured by the camera. The pattern may be of various kinds. For example, the pattern may be a checkerboard with some, such as every other square, having one emissitivity and the remaining squares having a different emissitivity, or having infrared light sources placed at corners of the squares. A difference between the emmissitivities may be sufficient so that the checkerboard pattern appears in an infrared image captured by the camera for calibration. The calibration may aid in determining intrinsic and extrinsic parameters of the camera. The parameters may provide a basis for transforming camera pixel coordinates to a world coordinate system which allows measurement of real world entities by the thermal camera. Measurements may incorporate distances between objects, heights of objects, and so forth.