The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Apr. 09, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hisayoshi Furihata, Tokyo, JP;

Masakazu Fujiki, Kawasaki, JP;

Kazuhiko Kobayashi, Yokohama, JP;

Masahiro Suzuki, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/232 (2006.01); G01J 9/00 (2006.01); G01B 11/25 (2006.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
H04N 5/23216 (2013.01); G01B 11/2522 (2013.01); G01J 9/00 (2013.01); G06T 7/521 (2017.01); G06T 7/593 (2017.01); G06T 7/62 (2017.01); G06T 2207/20076 (2013.01);
Abstract

A spread degree of a geometric feature in a surface of an object to be measured is estimated. The geometric feature is included in a geometric pattern, and will be observed in an image obtained by capturing the object on which the geometric pattern is projected. A parameter is set based on the estimated spread degree. Based on the parameter, a point on the geometric pattern is set in a captured image obtained by capturing the object to be measured on which the geometric pattern is projected. A three-dimensional position on the surface of the object corresponding to the set point is calculated.


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