The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Jun. 30, 2015
Texas Instruments Incorporated, Dallas, TX (US);
Gary Franklin Chard, Murphy, TX (US);
Erick Omar Torres, Allen, TX (US);
Karan Singh Jain, Dallas, TX (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method of decoding a biphase mark coded (BMC) data stream. A BMC encoded signal (BMC signal) including a preamble and data payload is received at a receiver which includes a BMC decoder state machine (state machine). The preamble is processed using the state machine including measuring a total duration spanning at least three transitions to provide a ≧2 UI duration measure, a calculated 0.75 UI duration value (0.75 UI duration value) is generated from the ≧2 UI duration measure, and the 0.75 UI duration value is compared to a programmed UI range. Provided the 0.75 UI duration value is within the programmed UI range data, respective bits are extracted bit-by-bit from the data payload using the 0.75 UI duration value to obtain unencoded data.