The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Mar. 29, 2016
Applicant:

Juniper Networks, Inc., Sunnyvale, CA (US);

Inventors:

Charles F. Barry, Santa Clara, CA (US);

Meenakshi S. Subramanian, San Jose, CA (US);

Feng Frank Pan, San Jose, CA (US);

Tian (Alan) Shen, Cupertino, CA (US);

Philip Kruzinski, Redwood City, CA (US);

Guochun (George) Zhao, Cupertino, CA (US);

DeviPrasad Natesan, San Jose, CA (US);

David R. Jorgensen, Santa Rosa, CA (US);

Assignee:

Juniper Networks, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01);
U.S. Cl.
CPC ...
H04J 3/0682 (2013.01); H04J 3/0667 (2013.01);
Abstract

An apparatus and method are described for compensating for frequency and phase variations of electronic components by processing packet delay values. In one embodiment, a packet delay determination module determines packet delay values based on time values associated with a first and a second electronic component. A packet delay selection module selects a subset of the packet delay values based on the maximum frequency drift of the first electronic component. A statistical parameter determination module evaluates a first and a second parameter based on portions of the subset of packet delay values. A validation module validates the parameters when each portion the subset of packet delay values includes a minimum of at least two packet delay values. An adjustment module compensates for at least one of a frequency variation and a phase variation of the first electronic component based on the parameters if the parameters are both validated.


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