The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Feb. 28, 2014
Applicant:

Microfabrica Inc., Van Nuys, CA (US);

Inventors:

Elliott R. Brown, Glendale, CA (US);

John D. Evans, Alexandria, VA (US);

Christopher A. Bang, Northridge, CA (US);

Adam L. Cohen, Dallas, TX (US);

Michael S. Lockard, Lake Elizabeth, CA (US);

Dennis R. Smalley, Newhall, CA (US);

Morton Grosser, Menlo Park, CA (US);

Assignee:

Microfabrica Inc., Van Nuys, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01P 3/00 (2006.01); H01P 1/202 (2006.01); G01P 15/08 (2006.01); G01P 15/125 (2006.01); H01P 3/06 (2006.01); H01P 5/18 (2006.01); H01P 11/00 (2006.01); C25D 1/00 (2006.01); H05K 3/46 (2006.01);
U.S. Cl.
CPC ...
H01P 1/202 (2013.01); C25D 1/003 (2013.01); G01P 15/0802 (2013.01); G01P 15/125 (2013.01); H01P 3/06 (2013.01); H01P 5/183 (2013.01); H01P 11/00 (2013.01); H01P 11/005 (2013.01); H01P 11/007 (2013.01); B81B 2201/042 (2013.01); H05K 3/4647 (2013.01); Y10T 29/49002 (2015.01); Y10T 29/49016 (2015.01); Y10T 29/49018 (2015.01);
Abstract

Multi-layer, multi-material fabrication methods include depositing at least one structural material and at least one sacrificial material during the formation of each of a plurality of layers wherein deposited materials for each layer are planarized to set a boundary level for the respective layer and wherein during formation of at least one layer at least three materials are deposited with a planarization operation occurring before deposition of the last material to set a planarization level above the layer boundary level and wherein a planarization occurs after deposition of the last material level above the layer boundary level and wherein a planarization occurs after deposition of the last material whereby the boundary level for the layer is set. Some formation processes use electrochemical fabrication techniques (e.g. including selective depositions, bulk depositions, etching operations and planarization operations) and post-deposition processes (e.g. selective etching operations and/or back filling operations).


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