The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Nov. 05, 2014
Applicant:

Skyworks Solutions, Inc., Woburn, MA (US);

Inventors:

Guillaume Alexandre Blin, Carlisle, MA (US);

Aniruddha B. Joshi, Irvine, CA (US);

Christophe Masse, Andover, MA (US);

Assignee:

Skyworks Solutions, Inc., Woburn, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 11/12 (2006.01); H04B 1/04 (2006.01); H01L 21/84 (2006.01); H01L 27/12 (2006.01); H01L 23/66 (2006.01); H01L 29/417 (2006.01); H01L 23/31 (2006.01); H01L 23/00 (2006.01); H01L 27/092 (2006.01);
U.S. Cl.
CPC ...
H01L 21/84 (2013.01); H01L 23/66 (2013.01); H01L 27/1203 (2013.01); H01L 29/41733 (2013.01); H01L 23/3121 (2013.01); H01L 24/06 (2013.01); H01L 24/48 (2013.01); H01L 27/092 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/05554 (2013.01); H01L 2224/06135 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48227 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/1306 (2013.01); H01L 2924/13091 (2013.01); H01L 2924/14215 (2013.01); H01L 2924/15192 (2013.01); H01L 2924/15313 (2013.01); H01L 2924/181 (2013.01); H01L 2924/19105 (2013.01);
Abstract

Improved linearity performance for radio-frequency (RF) switches. In some embodiments, a switching device can include a first terminal and a second terminal, and a plurality of switching elements connected in series to form a stack between the first terminal and the second terminal. The switching elements can have a non-uniform distribution of a parameter that results in the stack having a first linearity performance that is better than a second linearity performance corresponding to a similar stack having a substantially uniform distribution of the parameter.


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