The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Jun. 02, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Jiyoung Choi, Suwon-si, KR;
Young Hun Sung, Hwaseong-si, KR;
Jae Hak Lee, Yongin-si, KR;
Changhwan Kim, Daejeon, KR;
Miran Park, Daejeon, KR;
Seungryong Cho, Daejeon, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY, Daejeon-si, KR;
Abstract
Disclosed herein are an X-ray imaging apparatus and a method for the same. The X-ray imaging apparatus includes a kernel function setter configured to set a scatter kernel function in response to a scatter component included in first X-ray image data detected by an X-ray detector, and an image data corrector configured to generate second X-ray image data obtained by performing scatter correction on the first X-ray image data using the scatter kernel function and data consistency. According to the X-ray imaging apparatus and the control method for the same, scatter correction is performed by using data consistency so that accuracy of the scatter correction may be increased and an X-ray image may be generated based on the accuracy, thereby improving quality of the X-ray image.