The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Sep. 14, 2012
Yoshihisa Minato, Kyoto, JP;
Yukiko Yanagawa, Nara, JP;
Yoshihisa Minato, Kyoto, JP;
Yukiko Yanagawa, Nara, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An image examination method includes an acquisition step of acquiring a to-be-examined object image obtained by capturing an image of a to-be-examined object, a setting reading step of reading an examination region definition information from a storage device in which the examination region definition information is previously stored, an examination region extracting step of extracting a portion constituting the examination region as an examination region image from the to-be-examined object image based on the examination region definition information, and an examination process step of examining the to-be-examined object by analyzing the examination region image. The examination region definition information is a parameter used as a constraint condition in an optimum solution search process.