The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Oct. 07, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Masahiko Sugimoto, Saitama, JP;

Kenkichi Hayashi, Saitama, JP;

Yousuke Naruse, Saitama, JP;

Kosuke Irie, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06K 9/52 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G06K 9/522 (2013.01); H04N 5/23293 (2013.01); G06T 2207/20024 (2013.01);
Abstract

An image processing unitincludes a frequency analysis unit, an optical characteristic acquisition unit, and a filter acquisition unit. The frequency analysis unitacquires data in the frequency domain of each of first image data and second image data which are acquired by capturing an object image using a first optical system and a second optical system, respectively. The optical characteristic acquisition unitcompares the data in the frequency domain of the first image data with the data in the frequency domain of the second image data to acquire frequency characteristic data related to optical characteristics of the second optical system. The filter acquisition unitacquires a sharpening filter associated with the second optical system from a plurality of sharpening filters associated with the first optical system.


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