The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Feb. 27, 2013
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Jin-Hee Na, Seoul, KR;

Min-Chul Kim, Busan, KR;

Jae-Sik Sohn, Gyeonggi-do, KR;

Young-Kwon Yoon, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06T 3/40 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A method and apparatus for improving quality of an enlarged image are provided. The apparatus includes first and second image input units for outputting first and second images which are obtained by capturing the same subject at different positions spaced apart by a predetermined gap, a first image processor for converting a resolution of the first image to a preview resolution, a display for displaying the first image from the first image processor, a second image processor for, when an area to be enlarged in the displayed first image is selected, cropping an area corresponding to the selected area from the second image, and a controller for controlling the display to display the cropped area on the first image in an overlaying manner. Consequently, a user may view a high-magnification image cropped from a high-definition image and an original image together.


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