The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Mar. 31, 2014
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Taketo Akama, Sapporo, JP;

Josselin Kherroubi, Paris, FR;

Arnaud Etchecopar, La Rochelle, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/52 (2006.01); G01V 1/30 (2006.01); G06T 7/60 (2017.01); G06T 7/00 (2017.01); G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/52 (2013.01); G01V 1/301 (2013.01); G06T 7/0042 (2013.01); G06T 7/608 (2013.01); G01V 2210/64 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/10136 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/30181 (2013.01);
Abstract

Methods for dip determination from an image obtained by a down-hole imaging tool. For each pixel forming the image, a probability that a symmetry axis coincides with the pixel is determined. A probability map is then generated, depicting the determined probability of each pixel coinciding with the symmetry axis. The probability map and the image are then superposed to generate a mapped image. The symmetry axis is then estimated based on the mapped image. Image pixels coinciding with a boundary of the geologic feature are then selected in multiple depth zones, and a segment of a sinusoid is fitted to the selected image pixels within each depth zone. Dip within each of the depth zones is then determined based on the fitted sinusoid segments therein.


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