The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Feb. 27, 2013
Applicant:
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Inventors:
Assignee:
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01); G06F 17/16 (2006.01); G01B 11/02 (2006.01); G01B 11/245 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G01B 11/026 (2013.01); G01B 11/245 (2013.01);
Abstract
A normal-line detection method for finding the normal vector of a measurement surface of a measurement target by means of at least one distance detector and calculating the normal vector from the measurement results thus obtained is provided. The normal vector of the measurement surface is found by calculating the exterior product of a first vector which connects a first measurement point and a second measurement point and a second vector which connects a third measurement point and a fourth measurement point and is shifted in parallel such that an end thereof is set at any one of the first measurement point and the second measurement point.