The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Aug. 26, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Arthur J. Bariska, Jr., Tucson, AZ (US);

Matthew T. Cousens, Catskill, NY (US);

Eileen S. Kovalchick, Tucson, AZ (US);

Joel L. Masser, San Jose, CA (US);

Kevin D. McKenzie, Poughkeepsie, NY (US);

Eileen P. Tedesco, Sharon, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/302 (2013.01); G06F 11/3495 (2013.01);
Abstract

A deviance monitoring module is provided for examining various parameters of an operating system for deviance from a baseline behavior at specified intervals. A range of acceptable deviance values from a baseline behavior is set for parameters of an operating system. The parameters of the operating system are then monitored at specified intervals for deviance from the baseline behavior. In response to detecting that the deviance exceeds a predetermined threshold, the method triggers diagnostic data gathering on the parameters of the operating system according to an embodiment.


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