The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Sep. 25, 2015
International Business Machines Corporation, Armonk, NY (US);
Poonam P. Chitale, Cupertino, CA (US);
Catherine M. Cox, San Jose, CA (US);
Dario D'Angelo, Los Gatos, CA (US);
Xiyao Jiang, Shanghai, CN;
Shahin Mohammadi-Rashedi, San Jose, CA (US);
Thomas J. Pavela, San Jose, CA (US);
Jeffrey S. Rhodes, San Jose, CA (US);
Marian E. Sadowski, Sunnyvale, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Predicting software product quality. Real-time and historic software code metrics, software code defect data for the software product, and test case-related data for the software product are received. A feature predicted fallibility that estimates the number of code defects for a new feature of the software product, a product version projected fallibility that estimates the number of code defects for a new version of a software product, a test case related quality coefficient that estimates the likelihood of discovery of code defects in a new feature, a feature quality and a product quality indexes that are qualitative indications of quality of the new code of a feature and the new product version, are calculated. A report is then output that includes at least the calculated values, whereby developer resources are directed to features of the software product for which the calculated values indicate likelihoods of a high defect densities.