The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Jul. 08, 2015
Applicant:

Semmle Limited, Oxford, GB;

Inventors:

Julian Tibble, Oxford, GB;

Pavel Avgustinov, Oxford, GB;

Yorck Huenke, Oxford, GB;

Arthur Baars, Oxford, GB;

Assignee:

Semmle Limited, London, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 8/70 (2013.01); G06F 8/75 (2013.01); G06F 8/77 (2013.01); G06F 11/3688 (2013.01);
Abstract

Methods, systems, and apparatus, including computer programs encoded on computer storage media, for aggregating source code metric values. One of the methods includes obtaining data representing a directed graph, wherein one or more nodes of the graph are associated with a respective set of one or more metric instances, wherein each set of metric instances for each node includes all metric instances occurring in sets of any node descendant from the node in the graph, wherein each metric instance identifies a location in a source code base, and wherein each metric instance has a respective metric value, a respective identifier, and a respective attribute type. An attribute value is computed for a first node in the graph from the respective metric value of each metric instance in a first set of metric instances associated with the first node.


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