The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Feb. 19, 2014
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Takatsugu Ono, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0688 (2013.01); G06F 3/0607 (2013.01); G06F 3/0616 (2013.01); G06F 3/0649 (2013.01); G06F 3/0653 (2013.01);
Abstract

A processor or hard-wired logic circuit of an information processing device is configured to collect a life-expectancy index value of a first semiconductor storage device of primary semiconductor storage devices. The life-expectancy index value relates to a remaining number of times written data is able to be erased. The processor or hard-wired logic circuit is configured to collect read/write information regarding read/write access including read access of reading data from the first semiconductor storage device and write access of writing data to the first semiconductor storage device. The processor or hard-wired logic circuit is configured to determine, based on the collected read/write information, a criterion threshold used as a criterion for replacement of the first semiconductor storage device, and replace the first semiconductor storage device with a second semiconductor storage device of secondary semiconductor storage devices if the life-expectancy index value is less than the criterion threshold.


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