Information processing device and method for controlling replacement of semiconductor storage device

Abstract

A processor or hard-wired logic circuit of an information processing device is configured to collect a life-expectancy index value of a first semiconductor storage device of primary semiconductor storage devices. The life-expectancy index value relates to a remaining number of times written data is able to be erased. The processor or hard-wired logic circuit is configured to collect read/write information regarding read/write access including read access of reading data from the first semiconductor storage device and write access of writing data to the first semiconductor storage device. The processor or hard-wired logic circuit is configured to determine, based on the collected read/write information, a criterion threshold used as a criterion for replacement of the first semiconductor storage device, and replace the first semiconductor storage device with a second semiconductor storage device of secondary semiconductor storage devices if the life-expectancy index value is less than the criterion threshold.