The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Dec. 24, 2014
Applicant:
Amber Precision Instruments, Inc., San Jose, CA (US);
Inventor:
Hamed Kajbaf, Sunnyvale, CA (US);
Assignee:
Amber Precision Instruments, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 31/00 (2006.01); G01R 35/00 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0892 (2013.01);
Abstract
A system and method for performing radiation source analysis on a device under test (DUT) uses discrete Fourier transform on measured field components values at different sampling locations away from the DUT to derive field component values at locations on the DUT. The results of the discrete Fourier transform are multiplied by a complex phase adjustment term as a function of distance from the sampling locations to the DUT to translate the measured field component values back to the locations on the surface of the DUT.