The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 11, 2017

Filed:

Mar. 01, 2013
Applicants:

California Institute of Technology, Pasadena, CA (US);

University of Rochester, Rochester, NY (US);

Inventors:

Oskar Painter, Sierra Madre, CA (US);

Martin Winger, Meilen, CH;

Qiang Lin, Rochester, NY (US);

Alexander Krause, Alhambra, CA (US);

Tim D. Blasius, Pasadena, CA (US);

Assignees:

CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);

UNIVERSITY OF ROCHESTER, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 15/08 (2006.01); G01P 15/093 (2006.01); B81B 3/00 (2006.01); B81C 1/00 (2006.01); B82Y 99/00 (2011.01); G01N 21/55 (2014.01); G01N 21/59 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
G01P 15/093 (2013.01); B81B 3/0051 (2013.01); B81B 3/0067 (2013.01); B81B 3/0083 (2013.01); B81C 1/00015 (2013.01); B82Y 99/00 (2013.01); G01N 21/55 (2013.01); G01N 21/59 (2013.01); H01L 21/02373 (2013.01); B81B 2201/0235 (2013.01); G01N 2201/063 (2013.01); G01N 2201/06113 (2013.01);
Abstract

Technologies are generally described for operating and manufacturing optomechanical accelerometers. In some examples, an optomechanical accelerometer device is described that uses a cavity resonant displacement sensor based on a zipper photonic crystal nano-cavity to measure the displacement of an integrated test mass generated by acceleration applied to the chip. The cavity-resonant sensor may be fully integrated on-chip and exhibit an enhanced displacement resolution due to its strong optomechanical coupling. The accelerometer structure may be fabricated in a silicon nitride thin film and constitute a rectangular test mass flexibly suspended on high aspect ratio inorganic nitride nano-tethers under high tensile stress. By increasing the mechanical Q-factors through adjustment of tether width and tether length, the noise-equivalent acceleration (NEA) may be reduced, while maintaining a large operation bandwidth. The mechanical Q-factor may be improved with thinner (e.g., <1 micron) and longer tethers (e.g., 10-560 microns).


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