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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9618480 B1

PDFFull Text
Date of Patent:
Apr. 11, 2017

Filed:

Sep. 08, 2015

Method and apparatus for inspecting weld quality

Applicant:

Hitachi, Ltd, Tokyo, JP;

Inventors:

Isao Hoda, Novi, MI (US);

Hua Zeng, Novi, MI (US);

Masayoshi Takahashi, Yokohama, JP;

Hiroki Funato, Chigasaki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:

Mattingly & Malur, PC

Primary Examiner:

Reena Aurora

Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/83 (2006.01); B23K 31/12 (2006.01); G01N 27/90 (2006.01); G01N 27/72 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); B23K 31/125 (2013.01); G01N 27/72 (2013.01); G01N 27/9046 (2013.01); G01R 33/12 (2013.01);
Abstract

An apparatus and method for inspecting the quality of a weld under test in a structure having a plurality of spaced apart welds. Two probes are placed on opposite sides of the structure so that a current path is formed through the weld under test. The probes are energized with alternating current at a known frequency. The magnetic flux generated from the current flow through the probes and at least one of the spaced apart welds is then measured and subsequently compared with magnetic flux data previously determined and representing weld quality.

Find Patent Forward Citations

Hoda, Isao. (2017). Method and apparatus for inspecting weld quality (U.S. Patent No. 9618480). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9618480

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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