The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Sep. 08, 2015
Applicant:
Hitachi, Ltd, Tokyo, JP;
Inventors:
Isao Hoda, Novi, MI (US);
Hua Zeng, Novi, MI (US);
Masayoshi Takahashi, Yokohama, JP;
Hiroki Funato, Chigasaki, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/83 (2006.01); B23K 31/12 (2006.01); G01N 27/90 (2006.01); G01N 27/72 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); B23K 31/125 (2013.01); G01N 27/72 (2013.01); G01N 27/9046 (2013.01); G01R 33/12 (2013.01);
Abstract
An apparatus and method for inspecting the quality of a weld under test in a structure having a plurality of spaced apart welds. Two probes are placed on opposite sides of the structure so that a current path is formed through the weld under test. The probes are energized with alternating current at a known frequency. The magnetic flux generated from the current flow through the probes and at least one of the spaced apart welds is then measured and subsequently compared with magnetic flux data previously determined and representing weld quality.