The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Dec. 09, 2013
National Taiwan University, Taipei, TW;
Chi-Kuang Sun, Taipei, TW;
Yu-Hung Lai, Taipei, TW;
Chieh-Feng Chang, Taipei, TW;
Szu-Yu Lee, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
The present application discloses optical microscopy systems and related method that use modulation techniques and contrast agents to enable the systems to detect nonlinear photoacoustic signals with high spectrum sensitivity and frequency selectivity for imaging. A laser beam is amplitude modulated for pure sinusoidal modulation using either the loss modulation technique or the single light amplitude modulation technique. The sample used in the invention is an endogenous contrast agent by itself or is treated by at least one exogenous contrast agent to produce or enhance photoacoustic effect induced by multi-photon absorption. The modulated laser beam is focused via a focusing device onto a sample which absorbs multiple photons simultaneously and generates ultrasonic (acoustic) waves via nonlinear photoacoustic effect. The ultrasonic waves are received and transformed into electrical signals and the frequency signals within the electrical signals are detected and recorded to create images.