The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Jul. 09, 2013
Applicant:
Clearcorp, Longmont, CO (US);
Inventor:
Roger M. Jorden, Longmont, CO (US);
Assignee:
ClearCorp, Longmont, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 33/18 (2006.01); G01N 1/20 (2006.01); G01N 1/10 (2006.01); C02F 1/52 (2006.01); C02F 101/10 (2006.01); C02F 101/14 (2006.01); C02F 101/20 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0227 (2013.01); G01N 33/18 (2013.01); C02F 1/5209 (2013.01); C02F 2101/103 (2013.01); C02F 2101/105 (2013.01); C02F 2101/14 (2013.01); C02F 2101/20 (2013.01); C02F 2209/003 (2013.01); C02F 2209/006 (2013.01); C02F 2209/44 (2013.01); C02F 2303/04 (2013.01); G01N 1/2035 (2013.01); G01N 2001/1012 (2013.01);
Abstract
A system and method for isolating and analyzing a water sample in a water processing facility are disclosed. The system uses a chamber for receiving and isolating the water sample from the main water treatment process. An optical detector views and characterizes the particles in a region of the chamber. An analyzer coupled to the optical detector compares the characterized suspended particles at a first time and at with the characterized suspended particles at a second time to produce a report showing suspended particle size as a function of time.