The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 11, 2017
Filed:
Aug. 02, 2013
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Tetsuya Oda, Kobe, JP;
Keisuke Kuwano, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Shunsuke Ariyoshi, Kobe, JP;
SYSMEX CORPORATION, Kobe-Shi, Hyogo, JP;
Abstract
A specimen analysis system, a specimen analyzer, and a specimen analysis method are provided by which reexamination of a specimen can be executed more quickly than in conventional technology. A specimen analyzer measures a specimen and obtains an analysis result. The specimen analyzer determines the necessity of remeasurement of the specimen, based on a specimen analysis result. Also, the specimen analyzer determines, based on the specimen analysis result, whether or not determination of the necessity of remeasurement of the specimen based on examination information by the examination information management device is necessary. If it is determined that determination of the necessity of remeasurement of the specimen based on the examination information is necessary, the specimen analyzer makes a request to determine the necessity of remeasurement of the specimen based on the examination information, to the examination information management device.